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Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patternsTAGLIENTE, M. A; PENZA, M; GUSSO, M et al.Thin solid films. 1999, Vol 353, Num 1-2, pp 129-136, issn 0040-6090Article

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